Beilstein Arch. 2026, 202617. https://doi.org/10.3762/bxiv.2026.17.v1
Published 15 May 2026
Nanoscale transfer in metal--ceramic fretting originates at microcontacts but has remained experimentally unresolved. Here, we use an atomic force microscopy (AFM)-based topographical difference method to visualize the formation of sub-10 nm transfer films at a sapphire--chromium interface subjected to fretting. Transfer proceeds via adhesive wear of chromium at micrometer-scale contacts, followed by plastic compaction of the chromium debris into a conformal ∼5 nm transfer film. Excess debris is expelled from the circular contact and accumulates in a curvature-defined peripheral ring around the contact. These results connect microcontact fracture, debris evolution, and nanoscale transfer-film formation in fretting contacts.
Keywords: adhesive wear; atomic force microscopy; fretting; metal--ceramic interface; transfer film
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Çiftçi, H. T.; Şahin, O.; Roch, T.; Weber, B. Beilstein Arch. 2026, 202617. doi:10.3762/bxiv.2026.17.v1
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