,
,
,
,
and
Beilstein Arch. 2026, 20268. https://doi.org/10.3762/bxiv.2026.8.v1
Published 20 Feb 2026
The microstructure, transport and galvanometric properties of Ni48Fe12Cr40 thin films of various thickness, obtained by magnetron sputtering, were studied in the temperature range of 93 – 293 K. The Ni48Fe12Cr40 film with thickness of 5 nm has been found to be X-ray amorphous and exhibits negative temperature coefficient of resistance. The observation of anisotropic magnetoresistance, as well as anomalous and planar Hall effect, indicates the presence of ferromagnetic ordering in this sample. The increase of the Ni48Fe12Cr40 film thickness to 8 nm leads to the crystallization and texture formation, which promotes more uniform distribution of Cr atoms in Ni-Fe matrix and suppression of the long-range ferromagnetic order.
Keywords: NiFeCr alloy; thin films; magnetoresistance; Hall effect; permalloy
When a peer-reviewed version of this preprint is available, this information will be updated in the information box above. If no peer-reviewed version is available, please cite this preprint using the following information:
Zavornitsyn, R.; Milyaev, M.; Naumova, L.; Maksimova, I.; Pavlova, A.; Chernyshova, T.; Proglyado, V.; Ustinov, V. Beilstein Arch. 2026, 20268. doi:10.3762/bxiv.2026.8.v1
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and
Zotero.
© 2026 Zavornitsyn et al.; licensee Beilstein-Institut.
This is an open access work licensed under the terms of the Beilstein-Institut Open Access License Agreement (https://www.beilstein-archives.org/xiv/terms), which is identical to the Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0). The reuse of material under this license requires that the author(s), source and license are credited. Third-party material in this work could be subject to other licenses (typically indicated in the credit line), and in this case, users are required to obtain permission from the license holder to reuse the material.