Beilstein Arch. 2022, 202218. https://doi.org/10.3762/bxiv.2022.18.v1
Published 22 Mar 2022
We propose hybrid mode atomic force microscopy (AFM) of phase-modulation (PM) and frequency-modulation (FM) in constant amplitude (CA) mode to increase imaging speed of AFM in high-Q environments. We derive the relation among the phase shift, frequency shift and the tip-sample interaction force from the equation of motion for the cantilever in high-Q environments. The tip-sample conservative force is approximately given by the sum of the conservative force with respect to phase shift in PM mode and that with respect to frequency shift in FM mode. We preliminarily demonstrate that the hybrid AFM of PM and FM is a new very promising AFM operation mode that can increase imaging speed.
Keywords: atomic force microscopy (AFM), phase-modulation (PM), frequency modulation (FM), hybrid mode
When a peer-reviewed version of this preprint is available, this information will be updated in the information box above. If no peer-reviewed version is available, please cite this preprint using the following information:
Sugawara, Y.; Yamamoto, T.; Miyazaki, M.; Nomura, H.; Li, Y. J. Beilstein Arch. 2022, 202218. doi:10.3762/bxiv.2022.18.v1
|Download RIS (Reference Manager)||Download BIB (BIBTEX)|
© 2022 Sugawara et al.; licensee Beilstein-Institut.
This is an open access work licensed under the terms of the Beilstein-Institut Open Access License Agreement (https://www.beilstein-archives.org/xiv/terms), which is identical to the Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0). The reuse of material under this license requires that the author(s), source and license are credited. Third-party material in this work could be subject to other licenses (typically indicated in the credit line), and in this case, users are required to obtain permission from the license holder to reuse the material.