Hybrid Mode Atomic Force Microscopy of Phase-Modulation and Frequency-Modulation

Submitting author affiliation:
Osaka University, Osaka, Japan

Beilstein Arch. 2022, 202218. https://doi.org/10.3762/bxiv.2022.18.v1

Published 22 Mar 2022

Preprint
This preprint has not been peer-reviewed. When a peer-reviewed version is available, this information will be updated.

Abstract

We propose hybrid mode atomic force microscopy (AFM) of phase-modulation (PM) and frequency-modulation (FM) in constant amplitude (CA) mode to increase imaging speed of AFM in high-Q environments. We derive the relation among the phase shift, frequency shift and the tip-sample interaction force from the equation of motion for the cantilever in high-Q environments. The tip-sample conservative force is approximately given by the sum of the conservative force with respect to phase shift in PM mode and that with respect to frequency shift in FM mode. We preliminarily demonstrate that the hybrid AFM of PM and FM is a new very promising AFM operation mode that can increase imaging speed.

Keywords: atomic force microscopy (AFM), phase-modulation (PM), frequency modulation (FM), hybrid mode

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When a peer-reviewed version of this preprint is available, this information will be updated in the information box above. If no peer-reviewed version is available, please cite this preprint using the following information:

Sugawara, Y.; Yamamoto, T.; Miyazaki, M.; Nomura, H.; Li, Y. J. Beilstein Arch. 2022, 202218. doi:10.3762/bxiv.2022.18.v1

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