Stochastic excitation for high-resolution Atomic Force Acoustic Microscopy imaging: a system theory approach.

Submitting author affiliation:
Universidad Cuauhtemoc, Queretaro, Mexico

Beilstein Arch. 2019, 2019159.

Published 17 Dec 2019

cc-by Logo


In this work, a high-resolution Atomic Force Acoustic Microscopy imaging technique is shown in order to obtain the local indentation modulus at nanoscale using a model which gives a quantitative relationship between a set of contact resonance frequencies and indentation modulus through a white-noise excitation. This technique is based on white-noise excitation for system identification due to non-linearities in the tip-sample interaction. During a conventional scanning, a Fast Fourier Transform is applied to the deflection signal which comes from the photo-diodes of the Atomic Force Microscopy (AFM) for each pixel, while the tip-sample interaction is excited by a white-noise signal. This approach allows the measurement of several vibrational modes in a single step with high frequency resolution, less computational data and at a faster speed than other similar techniques. This technique is referred to as Stochastic Atomic Force Acoustic Microscopy (S-AFAM), where the frequency shifts with respect to free resonance frequencies for an AFM cantilever can be used to determine the mechanical properties of a material. S-AFAM is implemented and compared to a conventional technique (Resonance Tracking-Atomic Force Microscopy, RT-AFAM), where a graphite film over a glass substrate sample is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation compared to conventional techniques.

Keywords: Atomic Force Microscopy; Fast Fourier Transform; Mechanical properties; System theory; White noise

How to Cite

When a peer-reviewed version of this preprint is available, this information will be updated in the information box above. If no peer-reviewed version is available, please cite this preprint using the following information:

Cruz-Valeriano, E.; Gervacio Arciniega, J. J.; Hernández Landaverde, M. A.; Enriquez-Flores, C. I.; Chipatecua, Y.; Gutierrez-Peralta, A.; Ramírez-Bon, R.; Meraz-Dávila, S.; Moreno Palmerin, J.; Yañez-Limón, J. M. Beilstein Arch. 2019, 2019159. doi:10.3762/bxiv.2019.159.v1

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.